Sukirman, Engkir and Ahda, Syahfandi (2011) Qualitative and Quantitative Analysis of (Na0.5bi0.5)tio3 Phase with the X-ray Diffraction Technique Using the Rietveld Method. Jurnal Sains Materi Indonesia, 13 (1). pp. 69-74. ISSN 1411-1098
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Item Type: | Article |
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Subjects: | Taksonomi BATAN > Daur Bahan Bakar Nuklir dan Bahan Maju > Bahan Struktur dan Bahan Maju Taksonomi BATAN > Daur Bahan Bakar Nuklir dan Bahan Maju > Bahan Struktur dan Bahan Maju |
Divisions: | BATAN > Pusat Sains dan Teknologi Bahan Maju IPTEK > BATAN > Pusat Sains dan Teknologi Bahan Maju |
Depositing User: | Administrator Repository |
Date Deposited: | 01 Dec 2018 03:30 |
Last Modified: | 02 Jun 2022 02:24 |
URI: | https://karya.brin.go.id/id/eprint/7031 |