Qualitative and Quantitative Analysis of (Na0.5bi0.5)tio3 Phase with the X-ray Diffraction Technique Using the Rietveld Method

Sukirman, Engkir and Ahda, Syahfandi (2011) Qualitative and Quantitative Analysis of (Na0.5bi0.5)tio3 Phase with the X-ray Diffraction Technique Using the Rietveld Method. Jurnal Sains Materi Indonesia, 13 (1). pp. 69-74. ISSN 1411-1098

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Item Type:	Article
Subjects:	Taksonomi BATAN > Daur Bahan Bakar Nuklir dan Bahan Maju > Bahan Struktur dan Bahan Maju Taksonomi BATAN > Daur Bahan Bakar Nuklir dan Bahan Maju > Bahan Struktur dan Bahan Maju
Divisions:	BATAN > Pusat Sains dan Teknologi Bahan Maju IPTEK > BATAN > Pusat Sains dan Teknologi Bahan Maju
Depositing User:	Administrator Repository
Date Deposited:	01 Dec 2018 03:30
Last Modified:	02 Jun 2022 02:24
URI:	https://karya.brin.go.id/id/eprint/7031

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