Items where Division is "OR_Nanoteknologi_dan_Material" and Year is 1996
Number of items: 1.
Teguh, Rusyanto (1996) A study of HF treated Si single crsytal surfaces with XPS (x-ray photoelectron spectroscopy). Masters thesis, Nihon University.
Teguh, Rusyanto (1996) A study of HF treated Si single crsytal surfaces with XPS (x-ray photoelectron spectroscopy). Masters thesis, Nihon University.