Teguh, Rusyanto (1996) A study of HF treated Si single crsytal surfaces with XPS (x-ray photoelectron spectroscopy). Masters thesis, Nihon University.
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| Item Type: | Thesis (Masters) |
|---|---|
| Uncontrolled Keywords: | Silicon crystals—Surfaces, Hydrofluoric acid—Industrial applications, X-ray photoelectron spectroscopy |
| Subjects: | Physics Materials Sciences |
| Divisions: | OR_Nanoteknologi_dan_Material |
| Depositing User: | Rasty - |
| Date Deposited: | 16 Apr 2026 02:46 |
| Last Modified: | 16 Apr 2026 02:46 |
| URI: | https://karya.brin.go.id/id/eprint/54209 |
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