The Effect of Irradiation of Fe and Ar Ion on the Surface Morphology of Diamond Thin Film Related to the Magnetoresistance Property
Salim Mustofa 1 , Setyo Purwanto 1 , Kenji Mishima 2Affiliations:
- Center for Science and Technology of Advanced Materials, National Nuclear Energy Agency (PSTBM-BATAN) PUSPIPTEK Serpong, Tangerang 15314, Indonesia
- Department of Chemical Engineering, Faculty of Engineering, Fukuoka University, 8-19-1 Nanakuma, Jonan-ku, Fukuoka 814-0180, Japan
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References:
G. Devaraju, S.V.S. Nageswara Rao, N. Srinivasa Rao, V. Saikiran, T.K. Chan, T. Osipowicz, M.B.H. Breese, A.P. Pathak, Radiat. Eff. Defects in Solids. 167/7 (2012) 506.
Martin Kalbac, Ossi Lehtinen, et al, Adv. Mater (2012). DOI: 10.1002/adma.201203807.
P. D. Edmondson, Y. Zhang, S. Moll, F. Namavar, W.J. Weber. Acta Materialia 60 (2012) 5408.
S.B. Felch, M.I. Current and M.C. Taylor, Proceedings of PAC2013, Pasadena, CA USA (2013) 740.
S-X Xue, Q-T Li, X-R Zhao, Q-Y Shi, Z-G Li, YP Liu, J. Nanomater. (2014) 5.
S-I. Honda, R. Tamura, Y. Nosho, A. Tsukagoshi, M. Niibe, M. Terasawa, R. Hirase, H. Izumi, H. Yoshioka, K. Niwase, E. Taguchi, K-Y Lee, M. Oura. Jpn J. Appl. Phys. 53/2S (2014). http://dx.doi.org/10.7567/ JJAP.53.02BD06.
J-H Deng, X-G Hou, L. Cheng, F-J. Wang, B. Yu, G-Z. Li, D-J. Li, G-A. Cheng, S. Wu. ACS Appl. Mater. Interfaces. 6/7 (2014) 5137.
C.D. Cress, J.J. McMorrow, J.T. Robinson, B.J. Landi, S.M. Hubbard, S.R. Messenger. Electronics. 1/1 (2012) 23.
A. AnsÛn-Casaos, J.A. PuÈrtolas, F.J. Pascual et al, Appl. Surf. Sci. 301 (2014) 264.
F. Valencia, J.D. Mella, R.I. Gonzalez, M.K. Tichauer, E.M. Bringa, Carbon. 93 (2015) 458.
R.R. Nair, M. Sepioni, I-Ling Tsai, Nature Phys. 8 (2012) 199.
P. Esquinazi, H. Wolfram, D. Spemann. IEEE Trans. Magn. 49/8 (2013) 4668.
Z. Osváth, G. Vértesy, L. Tapasztó, F. Wéber, Z. E. Horváth, J. Gyulai, L.P. Biró, Phys. Rev. B 72 (2005) 045429.
H.M. Kim, H.S. Kim, S.K. Park, J. Joo, T.J. Lee, C.J. Lee, J. Appl. Phys. 97 (2005) 026103.
S. Purwanto, I. Sakamoto, Makara J. Technol. 18/2 (2014) 63.