A study of silicone single crsytal surfacesby x-ray photoelectron spectroscopy

Teguh, Rusyanto (1998) A study of silicone single crsytal surfacesby x-ray photoelectron spectroscopy. Doctoral thesis, Nihon University.

Text
Disertasi_TeguhRusyanto_NihonUniversity_1998_1.pdf - Submitted Version
Restricted to Registered users only
Download (12MB)

Item Type:	Thesis (Doctoral)
Uncontrolled Keywords:	Silicon crystals—Surfaces, X-ray photoelectron spectroscopy, Surface chemistry
Subjects:	Physics Materials Sciences
Divisions:	OR_Nanoteknologi_dan_Material
Depositing User:	Rasty -
Date Deposited:	16 Apr 2026 02:46
Last Modified:	16 Apr 2026 02:46
URI:	https://karya.brin.go.id/id/eprint/54212

Actions (login required)